SEMETROL was founded in 2005 to develop and market advanced semiconductor characterization and analysis
systems. The characterization methods include deep level transient spectroscopy (DLTS), current-voltage-temperature (IVT),
capacitance-voltage profiling (CV), photocapacitance (PC), thermal admittance spectroscopy (TAS), and other related methods.
Advanced data collection and analysis methods have been implemented in the products ot accelerate thorough characterization
of semiconductor materials, and assist in improving material and device quality. Each system has been carefully designed to
produce accurate results very efficiently.
New users of sophisticated characterization equipment
face a daunting challenge to understand not only the physics behind the measurements, but also the operational challenges
of obtaining valid data, and even more so, of obtaining valid analysis. SEMETROL's objectives are to build characterization
equipment that is easy to use, programmed to quickly collect low-noise data and provide a robust analysis environment,
and to furnish simulation utilities to check conditions and results, thereby establishing high confidence in the methods and
results.
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Daniel Johnstone formed Semetrol after gaining several years of experience in characterization and analysis with a
broad range of semiconductor materials. Professional preparation includes a PhD in Engineering Physics, Master's
Degree in Electrical Engineering, and Bachelor's Degrees in Electrical Engineering and in Ceramic Engineering. His
interest and experience in semiconductor properties was stimulated and fostered while working in two of the Air Force
research laboratories, and as a program manager for basic research in optoelectronic materials at the Air Force Office
of Scientific Research. At AFOSR he started several multi-million dollar research programs, including basic research for chalcopyrite
non-linear optical materials, phonons in device structures, and next-generation epitaxial crystal growth. |
